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Physics 901 Colloquium (Internal to Department)


Scanning Tunneling Microscopy Studies of Semiconductor Surfaces

Jenny MacLeod

Time
 
Mon. October 28, 2002     1:30 PM     Stirling A

Abstract
 
Since its conception almost 25 years ago, the scanning tunneling microscope (STM) has become a ubiquitous tool in the study of surfaces. Local probe characterization via STM has revolutionized the understanding of surface systems in terms of atom-resolved topographic and electronic information. As current technology continues its drive towards atomic-scale integrated circuit components, the information provided by STM is moving from the realm of surface science to the arena of application in technology. The NanoPhysics STM is a novel home-built instrument capable of resolving individual atoms on semiconductor surfaces. The design and performance of two generations of STMs will be described, and representative results will demonstrate the instruments^Ò capability for imaging, electronic characterization and interaction with surfaces. The motivation for new research focused on studying metal overlayer structures on semiconductor surfaces will also be discussed.

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